$ 5,263.44
Details
World's smallest ruler. Performs all major TEM calibrations at all magnification ranges, camera constant, image diffraction pattern rotation, and directly traceable to a natural constant. Ion milled cross section of a silicon single crystal, series of atomically flat layers of Si and SiGe, which have been grown epitaxially by MBE. When viewed in a TEM, it appears as a series of light and dark layers where the layer thicknesses are accurately known. The calibrated thickness measurements of these light and dark layers are based on careful TEM measurements of the lattice spacing of silicon, visible on the calibration sample itself, and supported by x-ray diffraction measurements. The layer spacing are designed so that the sample can be used to calibrate the entire magnification range in a TEM, from 1,000X to 1,000,000X. One single calibration sample can therefore be used to provide all three of the major TEM instrument calibration at all magnifications and all camera lengths.
