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MAC Microanalysis Standard Niobium Mount, 2, 3, or 5 mm, Each

848.91

Details

All of our standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. All of our standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification. Polished to 0.25 micron diamond and carbon coated. Available in 2, 3, and 5mm diameters.

Additional Information

SKU 1385821
UOM Each
UNSPSC 41116107
Manufacturer Part Number 80074NB