MAC Microanalysis Standard Tungsten Mount, 2, 3, or 5 mm, Each

Details

All of our standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. All of our standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification. Polished to 0.25 micron diamond and carbon coated. Available in 2, 3, and 5mm diameters.