SEM Tin On Carbon Test Specimen, Hitachi Stub, Each
$ 816.26
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Details
Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic checking of your instrument performance. This specimen consists of a dispersion of tin spheres, within the size range 10 - 40 nm, on a carbon substrate. Ideal for astigmatism correction, it is also recommended for use in SEM's employed in the semi-conductor industry where the usual gold on carbon specimen cannot be used because of the risk of gold poisoning.
Additional Information
SKU | 1383707 |
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UOM | Each |
UNSPSC | 41111700 |
Manufacturer Part Number | 7951504 |